Mardi 5
Conférence plénière
Prof. Vijay Nair, University of Michigan, USA
› 10:30 - 11:30 (1h)
› Amphithéatre
Process Monitoring, Anomaly Detection, and Beyond: New Directions and Applications
Vijay Nair  2, 1@  
2 : Department of Industrial & Operations Engineering, University of Michigan  -  Site web
1205 Beal Ave., Ann Arbor, MI 48109-2117 USA -  États-Unis
1 : Department of Statistics, University of Michigan  -  Site web
439 West Hall, 1085 South University Ave., Ann Arbor, MI 48109-1107 -  États-Unis

There is a huge literature on anomaly detection dealing with statistical process monitoring in manufacturing, engineering process control, and change-point detection. More recent work includes methods for multivariate data, time series, integrating statistical and engineering process control and so on. In this talk, we will provide a brief review of these methods and describe recent developments motivated by new applications. These include issues in advanced manufacturing, fraud detection in telecommunications and finance, fault detection in sensor networks, and monitoring quality of service in communications networks.


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